Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage

Alexei Komolov; Kjeld Schaumburg; Preben J. Møller; Vadim Monakhov

Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage

Alexei Komolov, Kjeld Schaumburg, Preben J. Møller, Vadim Monakhov

Department of Chemistry

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning

24 Citationer (Scopus)

Originalsprog	Engelsk
Tidsskrift	Applied Surface Science
Udgave nummer	142
Sider (fra-til)	591-597
ISSN	0169-4332
Status	Udgivet - 1999

Citationsformater

@article{8e37315074c611dbbee902004c4f4f50,

title = "Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage",

author = "Alexei Komolov and Kjeld Schaumburg and M{\o}ller, {Preben J.} and Vadim Monakhov",

year = "1999",

language = "English",

pages = "591--597",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier BV * North-Holland",

number = "142",

}

TY - JOUR

T1 - Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage

AU - Komolov, Alexei

AU - Schaumburg, Kjeld

AU - Møller, Preben J.

AU - Monakhov, Vadim

PY - 1999

Y1 - 1999

M3 - Journal article

SN - 0169-4332

SP - 591

EP - 597

JO - Applied Surface Science

JF - Applied Surface Science

IS - 142

ER -