Deep transfer learning for improving single-EEG arousal detection

Alexander Neergaard Olesen*, Poul Jennum, Emmanuel Mignot, Helge B.D. Sorensen

*Corresponding author af dette arbejde

Publikation: Bidrag til bog/antologi/rapportKonferencebidrag i proceedingsForskningpeer review

12 Citationer (Scopus)
9 Downloads (Pure)

Abstract

Datasets in sleep science present challenges for machine learning algorithms due to differences in recording setups across clinics. We investigate two deep transfer learning strategies for overcoming the channel mismatch problem for cases where two datasets do not contain exactly the same setup leading to degraded performance in single-EEG models. Specifically, we train a baseline model on multivariate polysomnography data and subsequently replace the first two layers to prepare the architecture for single-channel electroencephalography data. Using a fine-tuning strategy, our model yields similar performance to the baseline model (F1=0.682 and F1=0.694, respectively), and was significantly better than a comparable single-channel model. Our results are promising for researchers working with small databases who wish to use deep learning models pre-trained on larger databases.

OriginalsprogEngelsk
Titel42nd Annual International Conferences of the IEEE Engineering in Medicine and Biology Society : Enabling Innovative Technologies for Global Healthcare, EMBC 2020
Antal sider5
ForlagIEEE
Publikationsdato2020
Sider99-103
Artikelnummer9176723
ISBN (Elektronisk)9781728119908
DOI
StatusUdgivet - 2020
Begivenhed42nd Annual International Conferences of the IEEE Engineering in Medicine and Biology Society, EMBC 2020 - Montreal, Canada
Varighed: 20 jul. 202024 jul. 2020

Konference

Konference42nd Annual International Conferences of the IEEE Engineering in Medicine and Biology Society, EMBC 2020
Land/OmrådeCanada
ByMontreal
Periode20/07/202024/07/2020
NavnProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
ISSN2375-7477

Bibliografisk note

Publisher Copyright:
© 2020 IEEE.

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