Enhancing membrane-based scanning force microscopy through an optical cavity

Thomas Gisler; David Hälg; Vincent Dumont; Shobhna Misra; Letizia Catalini; Eric C. Langman; Albert Schliesser; Christian L. Degen; Alexander Eichler

doi:10.1103/PhysRevApplied.22.044001

Enhancing membrane-based scanning force microscopy through an optical cavity

Thomas Gisler, David Hälg, Vincent Dumont, Shobhna Misra, Letizia Catalini, Eric C. Langman, Albert Schliesser, Christian L. Degen, Alexander Eichler

Kvanteoptik

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

1 Citationer (Scopus)

Originalsprog	Engelsk
Artikelnummer	044001
Tidsskrift	Physical Review Applied
Vol/bind	22
Udgave nummer	4
Antal sider	11
ISSN	2331-7019
DOI	https://doi.org/10.1103/PhysRevApplied.22.044001
Status	Udgivet - 1 okt. 2024

Adgang til dokumentet

10.1103/PhysRevApplied.22.044001

https://arxiv.org/pdf/2406.07171Licens: CC BY

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PhysRevApplied.22.044001
Forlagets udgivne version, 3,6 MB
Embargo slutter: 01/10/2025

Citationsformater

Enhancing membrane-based scanning force microscopy through an optical cavity. / Gisler, Thomas; Hälg, David; Dumont, Vincent; Misra, Shobhna; Catalini, Letizia; Langman, Eric C.; Schliesser, Albert; Degen, Christian L.; Eichler, Alexander.

I: Physical Review Applied, Bind 22, Nr. 4, 044001, 01.10.2024.

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

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AU - Schliesser, Albert

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