Stacked generative adversarial networks

Xun Huang, Yixuan Li, Omid Poursaeed, John Hopcroft, Serge Belongie

Publikation: Bidrag til tidsskriftKonferenceartikelForskningpeer review

272 Citationer (Scopus)

Abstract

In this paper, we propose a novel generative model named Stacked Generative Adversarial Networks (SGAN), which is trained to invert the hierarchical representations of a bottom-up discriminative network. Our model consists of a top-down stack of GANs, each learned to generate lower-level representations conditioned on higher-level representations. A representation discriminator is introduced at each feature hierarchy to encourage the representation manifold of the generator to align with that of the bottom-up discriminative network, leveraging the powerful discriminative representations to guide the generative model. In addition, we introduce a conditional loss that encourages the use of conditional information from the layer above, and a novel entropy loss that maximizes a variational lower bound on the conditional entropy of generator outputs. We first train each stack independently, and then train the whole model end-to-end. Unlike the original GAN that uses a single noise vector to represent all the variations, our SGAN decomposes variations into multiple levels and gradually resolves uncertainties in the top-down generative process. Based on visual inspection, Inception scores and visual Turing test, we demonstrate that SGAN is able to generate images of much higher quality than GANs without stacking.

OriginalsprogEngelsk
TidsskriftProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
Sider (fra-til)1866-1875
Antal sider10
DOI
StatusUdgivet - 6 nov. 2017
Udgivet eksterntJa
Begivenhed30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017 - Honolulu, USA
Varighed: 21 jul. 201726 jul. 2017

Konference

Konference30th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017
Land/OmrådeUSA
ByHonolulu
Periode21/07/201726/07/2017

Bibliografisk note

Publisher Copyright:
© 2017 IEEE.

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