Towards scanning nanostructure X-ray microscopy

Anton Kovyakh; Soham Banerjee; Chia-hao Liu; Christopher J. Wright; Yuguang C. Li; Thomas E. Mallouk; Robert Feidenhans'l; Simon J. L. Billinge

doi:10.1107/S1600576723005927

Towards scanning nanostructure X-ray microscopy

Anton Kovyakh, Soham Banerjee, Chia-hao Liu, Christopher J. Wright, Yuguang C. Li, Thomas E. Mallouk, Robert Feidenhans'l, Simon J. L. Billinge

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

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Originalsprog	Engelsk
Tidsskrift	Journal of Applied Crystallography
Vol/bind	56
Udgave nummer	4
Sider (fra-til)	1221-1228
Antal sider	8
ISSN	0021-8898
DOI	https://doi.org/10.1107/S1600576723005927
Status	Udgivet - 1 aug. 2023

Adgang til dokumentet

10.1107/S1600576723005927Licens: CC BY

vb5028Forlagets udgivne version, 1,15 MBLicens: CC BY

Citationsformater

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title = "Towards scanning nanostructure X-ray microscopy",

author = "Anton Kovyakh and Soham Banerjee and Chia-hao Liu and Wright, {Christopher J.} and Li, {Yuguang C.} and Mallouk, {Thomas E.} and Robert Feidenhans'l and Billinge, {Simon J. L.}",

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AU - Kovyakh, Anton

AU - Banerjee, Soham

AU - Liu, Chia-hao

AU - Wright, Christopher J.

AU - Li, Yuguang C.

AU - Mallouk, Thomas E.

AU - Feidenhans'l, Robert

AU - Billinge, Simon J. L.

PY - 2023/8/1

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DO - 10.1107/S1600576723005927

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JF - Journal of Applied Crystallography

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