Using grating based X-ray contrast modalities for metrology

Jais Andreas Breusch Angel, Torsten Lauridsen, Robert Krarup Feidenhans'l, Mikkel Schou Nielsen, Leonardo De Chiffre

Publikation: Bidrag til bog/antologi/rapportKonferencebidrag i proceedingsForskningpeer review

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OriginalsprogEngelsk
TitelProceedings of the 14th euspen International Conference : 02/06/14 → 06/06/14, Dubrovnik, Croatia
UdgivelsesstedDubrovnik, Croatia
Publikationsdato2 jun. 2014
Udgaveeuspen
Sider157-160
StatusUdgivet - 2 jun. 2014

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