Abstract
We measure the low-temperature resistance of permalloy break junctions as a function of contact size and the magnetic field angle in applied fields large enough to saturate the magnetization. For both nanometer-scale metallic contacts and tunneling devices we observe large changes in resistance with the angle, as large as 25% in the tunneling regime. The pattern of magnetoresistance is sensitive to changes in bias on a scale of a few mV. We interpret the effect as a consequence of conductance fluctuations due to quantum interference.
Original language | English |
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Journal | Physical Review Letters |
Volume | 97 |
Issue number | 12 |
Pages (from-to) | 127202 |
Number of pages | 4 |
ISSN | 0031-9007 |
DOIs | |
Publication status | Published - 1 Jan 2006 |