CBED crystal polarity analysis of compound semiconductor nanostructures

E. Spiecker, W. Jäger, Erik Johnson, Martin Aagesen, C.B. Sørensen, Poul Erik Lindelof

Research output: Contribution to journal › Conference article › Research

Original language	English
Journal	Microscopy and Microanalysis
Volume	13
Issue number	Suppl. 3
Pages (from-to)	120-121
Number of pages	2
ISSN	1431-9276
Publication status	Published - 2007
Event	MC 2007 : Conference of the DGE, Deutschen Gesellschaft für elektronmikroskopie e.V. - Saarbrücken, Germany Duration: 2 Sept 2007 → 7 Sept 2007 Conference number: 33

Conference	MC 2007 : Conference of the DGE, Deutschen Gesellschaft für elektronmikroskopie e.V.
Number	33
Country/Territory	Germany
City	Saarbrücken
Period	02/09/2007 → 07/09/2007

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title = "CBED crystal polarity analysis of compound semiconductor nanostructures",

author = "E. Spiecker and W. J{\"a}ger and Erik Johnson and Martin Aagesen and C.B. S{\o}rensen and Lindelof, {Poul Erik}",

year = "2007",

language = "English",

volume = "13",

pages = "120--121",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Suppl. 3",

note = "MC 2007 : Conference of the DGE, Deutschen Gesellschaft f{\"u}r elektronmikroskopie e.V. ; Conference date: 02-09-2007 Through 07-09-2007",

}

TY - GEN

T1 - CBED crystal polarity analysis of compound semiconductor nanostructures

AU - Spiecker, E.

AU - Jäger, W.

AU - Johnson, Erik

AU - Aagesen, Martin

AU - Sørensen, C.B.

AU - Lindelof, Poul Erik

N1 - Conference code: 33

PY - 2007

Y1 - 2007

M3 - Conference article

SN - 1431-9276

VL - 13

SP - 120

EP - 121

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Suppl. 3

T2 - MC 2007 : Conference of the DGE, Deutschen Gesellschaft für elektronmikroskopie e.V.

Y2 - 2 September 2007 through 7 September 2007

ER -