Correlation between Electrical Transport and Nanoscale Strain in InAs/In06Ga04As Core-Shell Nanowires

Lunjie Zeng; Christoph Gammer; Burak Ozdol; Thomas Nordqvist; Jesper Nygard; Peter Krogstrup; Andrew M. Minor; Wolfgang Jaeger; Eva Olsson

doi:10.1021/acs.nanolett.8b01782

Correlation between Electrical Transport and Nanoscale Strain in InAs/In₀₆Ga₀₄As Core-Shell Nanowires

Lunjie Zeng, Christoph Gammer, Burak Ozdol, Thomas Nordqvist, Jesper Nygard, Peter Krogstrup, Andrew M. Minor, Wolfgang Jaeger, Eva Olsson

Condensed Matter Physics

Research output: Contribution to journal › Journal article › Research › peer-review

17 Citations (Scopus)

161 Downloads (Pure)

Original language	English
Journal	Nano Letters
Volume	18
Issue number	8
Pages (from-to)	4949-4956
Number of pages	8
ISSN	1530-6984
DOIs	https://doi.org/10.1021/acs.nanolett.8b01782
Publication status	Published - 25 Jul 2018

Bibliographical note

[Qdev]

Keywords

InAs nanowire
strain mapping
piezoresistance
transmission electron microscopy

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10.1021/acs.nanolett.8b01782Licence: CC BY-NC

acs.nanolett.8b01782Final published version, 3.84 MBLicence: CC BY-NC

Cite this

Correlation between Electrical Transport and Nanoscale Strain in InAs/In₀₆Ga₀₄As Core-Shell Nanowires. / Zeng, Lunjie; Gammer, Christoph; Ozdol, Burak; Nordqvist, Thomas ; Nygard, Jesper ; Krogstrup, Peter; Minor, Andrew M.; Jaeger, Wolfgang; Olsson, Eva.

In: Nano Letters, Vol. 18, No. 8, 25.07.2018, p. 4949-4956.

Research output: Contribution to journal › Journal article › Research › peer-review

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