High-Quality Reduced Graphene Oxide Electrodes for Sub-Kelvin Studies of Molecular Monolayer Junctions

Martin Kuhnel; Marc H. Overgaard; Morten C. Hels; Ajuan Cui; Tom Vosch; Jesper Nygard; Tao Li; Bo W. Laursen; Kasper Norgaard

doi:10.1021/acs.jpcc.8b08377

High-Quality Reduced Graphene Oxide Electrodes for Sub-Kelvin Studies of Molecular Monolayer Junctions

Martin Kuhnel, Marc H. Overgaard, Morten C. Hels, Ajuan Cui, Tom Vosch, Jesper Nygard, Tao Li, Bo W. Laursen, Kasper Norgaard

Research output: Contribution to journal › Journal article › Research › peer-review

9 Citations (Scopus)

Original language	English
Journal	Journal of Physical Chemistry C
Volume	122
Issue number	43
Pages (from-to)	25102-25109
Number of pages	8
ISSN	1932-7447
DOIs	https://doi.org/10.1021/acs.jpcc.8b08377
Publication status	Published - 15 Oct 2018

Bibliographical note

[Qdev]

Access to Document

10.1021/acs.jpcc.8b08377

acs.jpcc.8b08377Final published version, 3.35 MB

Cite this

High-Quality Reduced Graphene Oxide Electrodes for Sub-Kelvin Studies of Molecular Monolayer Junctions. / Kuhnel, Martin; Overgaard, Marc H.; Hels, Morten C.; Cui, Ajuan; Vosch, Tom ; Nygard, Jesper; Li, Tao; Laursen, Bo W.; Norgaard, Kasper.

In: Journal of Physical Chemistry C, Vol. 122, No. 43, 15.10.2018, p. 25102-25109.

Research output: Contribution to journal › Journal article › Research › peer-review

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AU - Cui, Ajuan

AU - Vosch, Tom

AU - Nygard, Jesper

AU - Li, Tao

AU - Laursen, Bo W.

AU - Norgaard, Kasper

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