Imaging electromigration during the formation of break junctions.

Thiti Taychatanapat; Kirill I Bolotin; Ferdinand Kuemmeth; Daniel C Ralph

doi:DOI: 10.1021/nl062631i

Imaging electromigration during the formation of break junctions.

Thiti Taychatanapat, Kirill I Bolotin, Ferdinand Kuemmeth, Daniel C Ralph

Research output: Contribution to journal › Journal article › Research › peer-review

124 Citations (Scopus)

434 Downloads (Pure)

Abstract

Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.

Original language	English
Journal	Nano Letters
Volume	7
Issue number	3
Pages (from-to)	652-656
Number of pages	5
ISSN	1530-6984
DOIs	https://doi.org/DOI: 10.1021/nl062631i
Publication status	Published - 1 Jan 2007
Externally published	Yes

Access to Document

DOI: 10.1021/nl062631i

Nl062631iFinal published version, 129 KB

http://pubs.acs.org/doi/abs/10.1021/nl062631i

Cite this

@article{43357f9ea0704481b15f1afb2712ab06,

title = "Imaging electromigration during the formation of break junctions.",

abstract = "Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.",

author = "Thiti Taychatanapat and Bolotin, {Kirill I} and Ferdinand Kuemmeth and Ralph, {Daniel C}",

year = "2007",

month = jan,

day = "1",

doi = "DOI: 10.1021/nl062631i",

language = "English",

volume = "7",

pages = "652--656",

journal = "Nano Letters",

issn = "1530-6984",

publisher = "American Chemical Society",

number = "3",

}

TY - JOUR

T1 - Imaging electromigration during the formation of break junctions.

AU - Taychatanapat, Thiti

AU - Bolotin, Kirill I

AU - Kuemmeth, Ferdinand

AU - Ralph, Daniel C

PY - 2007/1/1

Y1 - 2007/1/1

N2 - Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.

AB - Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.

U2 - DOI: 10.1021/nl062631i

DO - DOI: 10.1021/nl062631i

M3 - Journal article

VL - 7

SP - 652

EP - 656

JO - Nano Letters

JF - Nano Letters

SN - 1530-6984

IS - 3

ER -