McXtrace: a Monte Carlo software package for simulation of X-ray optics, beamlines, and experiments

Erik Bergbäck Knudsen; Andrea Prodi; Jana Baltser; Maria Thomsen; Peter Kjær Willendrup; Manuel Sanchez del Rio; Claudio Ferrero; Emmanuel Farhi; Martin Kristoffer Haldrup; Anette Vickery; Robert Krarup Feidenhans'l; Kell Mortensen; Martin Meedom Nielsen; Henning Friis Poulsen; Søren Schmidt; Kim Lefmann

doi:10.1107/S0021889813007991

McXtrace: a Monte Carlo software package for simulation of X-ray optics, beamlines, and experiments

Erik Bergbäck Knudsen, Andrea Prodi, Jana Baltser, Maria Thomsen, Peter Kjær Willendrup, Manuel Sanchez del Rio, Claudio Ferrero, Emmanuel Farhi, Martin Kristoffer Haldrup, Anette Vickery, Robert Krarup Feidenhans'l, Kell Mortensen, Martin Meedom Nielsen, Henning Friis Poulsen, Søren Schmidt, Kim Lefmann

Research output: Contribution to journal › Journal article › Research › peer-review

76 Citations (Scopus)

Original language	English
Journal	Journal of Applied Crystallography
Volume	46
Issue number	Part 3
Pages (from-to)	679-696
Number of pages	18
ISSN	0021-8898
DOIs	https://doi.org/10.1107/S0021889813007991
Publication status	Published - 1 Jun 2013

Access to Document

10.1107/S0021889813007991

McXtrace: a Monte Carlo software package for simulating X-ray optics, beamlines and experimentsFinal published version, 2.28 MB

Cite this

Bergbäck Knudsen, E., Prodi, A., Baltser, J., Thomsen, M., Willendrup, P. K., del Rio, M. S., Ferrero, C., Farhi, E., Haldrup, M. K., Vickery, A., Feidenhans'l, R. K., Mortensen, K., Nielsen, M. M., Poulsen, H. F., Schmidt, S., & Lefmann, K. (2013). McXtrace: a Monte Carlo software package for simulation of X-ray optics, beamlines, and experiments. Journal of Applied Crystallography, 46(Part 3), 679-696. https://doi.org/10.1107/S0021889813007991

McXtrace : a Monte Carlo software package for simulation of X-ray optics, beamlines, and experiments. / Bergbäck Knudsen, Erik; Prodi, Andrea; Baltser, Jana; Thomsen, Maria; Willendrup, Peter Kjær; del Rio, Manuel Sanchez; Ferrero, Claudio; Farhi, Emmanuel; Haldrup, Martin Kristoffer; Vickery, Anette; Feidenhans'l, Robert Krarup ; Mortensen, Kell; Nielsen, Martin Meedom; Poulsen, Henning Friis; Schmidt, Søren; Lefmann, Kim.

In: Journal of Applied Crystallography, Vol. 46, No. Part 3, 01.06.2013, p. 679-696.

Research output: Contribution to journal › Journal article › Research › peer-review

Bergbäck Knudsen, E, Prodi, A, Baltser, J, Thomsen, M, Willendrup, PK, del Rio, MS, Ferrero, C, Farhi, E, Haldrup, MK, Vickery, A, Feidenhans'l, RK , Mortensen, K, Nielsen, MM, Poulsen, HF, Schmidt, S & Lefmann, K 2013, 'McXtrace: a Monte Carlo software package for simulation of X-ray optics, beamlines, and experiments', Journal of Applied Crystallography, vol. 46, no. Part 3, pp. 679-696. https://doi.org/10.1107/S0021889813007991

Bergbäck Knudsen, Erik ; Prodi, Andrea ; Baltser, Jana ; Thomsen, Maria ; Willendrup, Peter Kjær ; del Rio, Manuel Sanchez ; Ferrero, Claudio ; Farhi, Emmanuel ; Haldrup, Martin Kristoffer ; Vickery, Anette ; Feidenhans'l, Robert Krarup ; Mortensen, Kell ; Nielsen, Martin Meedom ; Poulsen, Henning Friis ; Schmidt, Søren ; Lefmann, Kim. / McXtrace : a Monte Carlo software package for simulation of X-ray optics, beamlines, and experiments. In: Journal of Applied Crystallography. 2013 ; Vol. 46, No. Part 3. pp. 679-696.

@article{218538563ddc4d948e47e9e03a77d2a4,

title = "McXtrace: a Monte Carlo software package for simulation of X-ray optics, beamlines, and experiments",

author = "{Bergb{\"a}ck Knudsen}, Erik and Andrea Prodi and Jana Baltser and Maria Thomsen and Willendrup, {Peter Kj{\ae}r} and {del Rio}, {Manuel Sanchez} and Claudio Ferrero and Emmanuel Farhi and Haldrup, {Martin Kristoffer} and Anette Vickery and Feidenhans'l, {Robert Krarup} and Kell Mortensen and Nielsen, {Martin Meedom} and Poulsen, {Henning Friis} and S{\o}ren Schmidt and Kim Lefmann",

year = "2013",

month = jun,

day = "1",

doi = "10.1107/S0021889813007991",

language = "English",

volume = "46",

pages = "679--696",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "Wiley-Blackwell",

number = "Part 3",

}

TY - JOUR

T1 - McXtrace

T2 - a Monte Carlo software package for simulation of X-ray optics, beamlines, and experiments

AU - Bergbäck Knudsen, Erik

AU - Prodi, Andrea

AU - Baltser, Jana

AU - Thomsen, Maria

AU - Willendrup, Peter Kjær

AU - del Rio, Manuel Sanchez

AU - Ferrero, Claudio

AU - Farhi, Emmanuel

AU - Haldrup, Martin Kristoffer

AU - Vickery, Anette

AU - Feidenhans'l, Robert Krarup

AU - Mortensen, Kell

AU - Nielsen, Martin Meedom

AU - Poulsen, Henning Friis

AU - Schmidt, Søren

AU - Lefmann, Kim

PY - 2013/6/1

Y1 - 2013/6/1

U2 - 10.1107/S0021889813007991

DO - 10.1107/S0021889813007991

M3 - Journal article

VL - 46

SP - 679

EP - 696

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

SN - 0021-8898

IS - Part 3

ER -