Measurement of strain in the InGaN/GaN heterogeneous nanostructures

Tomas Stankevic, S. Mickevicius, Mikkel Schou Nielsen, Robert Krarup Feidenhans'l, Olga Kryliouk, Rafal Ciechonski, Giuliano Vescovi, Z. Bi, Anders Mikkelsen, Lars Samuelsen, Carsten Gundlach

Research output: Contribution to journalJournal articleResearchpeer-review

20 Citations (Scopus)
Original languageEnglish
JournalJournal of Applied Crystallography
Volume48
Issue numberPart 2
Pages (from-to)344-349
Number of pages6
ISSN0021-8898
DOIs
Publication statusPublished - 12 Nov 2015

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