Resolution enhancement of scanning four-point-probe measurements on two-dimensional systems

Torben M. Hansen; Kurt Stokbro; Ole Hansen; Tue Hassenkam; Ichiro Shiraki; Shuji Hasegawa; Peter Bøggild

doi:10.1063/1.1589161

Resolution enhancement of scanning four-point-probe measurements on two-dimensional systems

Torben M. Hansen, Kurt Stokbro, Ole Hansen, Tue Hassenkam, Ichiro Shiraki, Shuji Hasegawa, Peter Bøggild

Department of Chemistry

Research output: Contribution to journal › Journal article › Research › peer-review

26 Citations (Scopus)

Abstract

A method for resolution enhancement of scanning four-point-probe measurements on two-dimensional systems was presented. The resolution can be improved by a factor of approximately 50 to better than 1/15 of the four-point-probe electrode spacing by mapping the conductance on a dense grid around a target area and postprocessing the data. The results showed that the method can resolve the conductivity with submicron resolution.

Original language	English
Journal	Review of Scientific Instruments
Volume	74
Issue number	8
Pages (from-to)	3701-3708
Number of pages	8
ISSN	0034-6748
DOIs	https://doi.org/10.1063/1.1589161
Publication status	Published - 2003

Access to Document

10.1063/1.1589161

Cite this

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title = "Resolution enhancement of scanning four-point-probe measurements on two-dimensional systems",

abstract = "A method for resolution enhancement of scanning four-point-probe measurements on two-dimensional systems was presented. The resolution can be improved by a factor of approximately 50 to better than 1/15 of the four-point-probe electrode spacing by mapping the conductance on a dense grid around a target area and postprocessing the data. The results showed that the method can resolve the conductivity with submicron resolution.",

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T1 - Resolution enhancement of scanning four-point-probe measurements on two-dimensional systems

AU - Hansen, Torben M.

AU - Stokbro, Kurt

AU - Hansen, Ole

AU - Hassenkam, Tue

AU - Shiraki, Ichiro

AU - Hasegawa, Shuji

AU - Bøggild, Peter

PY - 2003

Y1 - 2003

N2 - A method for resolution enhancement of scanning four-point-probe measurements on two-dimensional systems was presented. The resolution can be improved by a factor of approximately 50 to better than 1/15 of the four-point-probe electrode spacing by mapping the conductance on a dense grid around a target area and postprocessing the data. The results showed that the method can resolve the conductivity with submicron resolution.

AB - A method for resolution enhancement of scanning four-point-probe measurements on two-dimensional systems was presented. The resolution can be improved by a factor of approximately 50 to better than 1/15 of the four-point-probe electrode spacing by mapping the conductance on a dense grid around a target area and postprocessing the data. The results showed that the method can resolve the conductivity with submicron resolution.

U2 - 10.1063/1.1589161

DO - 10.1063/1.1589161

M3 - Journal article

AN - SCOPUS:0042878586

SN - 0034-6748

VL - 74

SP - 3701

EP - 3708

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 8

ER -