Abstract
Atom interferometry has proven both a powerful means for probing fundamental physics, and a promising technology for high-precision inertial sensing. However, their performance has been limited by the available interrogation time of atoms falling freely in Earth's gravitational field. Trapped geometries have thus been explored as a means to improve the sensitivity of atom interferometers, but attempts to date have suffered from decoherence caused by trap inhomogeneities. We have demonstrated a trapped atom interferometer with an unprecedented interrogation time of 20 seconds,1 achieved by trapping the interferometer in the resonant mode of an optical cavity. The cavity is instrumental to this advance, as it provides spatial mode filtering for the trapping potential. Because the interferometer is held with the arms vertically separated along the gravitational axis, a phase shift accumulates due to the gravitational potential energy difference between the arms. Moreover, this phase accumulates continuously during the hold time, providing an orders-of-magnitude greater immunity to vibrations than previous atom-interferometric gravimeters at the same sensitivity.
Original language | English |
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Title of host publication | Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II |
Editors | Selim M. Shahriar, Jacob Scheuer |
Number of pages | 8 |
Place of Publication | San Francisco, California, USA |
Publisher | SPIE - International Society for Optical Engineering |
Publication date | 2020 |
Article number | 112961R |
ISBN (Electronic) | 9781510633551 |
DOIs | |
Publication status | Published - 2020 |
Event | Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II 2020 - San Francisco, United States Duration: 1 Feb 2020 → 6 Feb 2020 |
Conference
Conference | Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II 2020 |
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Country/Territory | United States |
City | San Francisco |
Period | 01/02/2020 → 06/02/2020 |
Sponsor | The Society of Photo-Optical Instrumentation Engineers (SPIE) |
Series | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 11296 |
ISSN | 0277-786X |
Bibliographical note
Publisher Copyright:© 2020 SPIE.
Keywords
- Atom interferometry
- Atomic physics
- metrology
- optical cavities
- optical lattices
- quantum sensors