TEM of free standing InAs nanoplates grown by molecular beam epitaxy

Erik Johnson, Martin Aagesen, C.B. Sørensen, Poul Erik Lindelof, P.E. Spiecker, W. Jäger

Research output: Contribution to journal › Conference article › Research

Original language	English
Journal	Microscopy and Microanalysis
Volume	13
Issue number	Suppl. 3
Pages (from-to)	322-323
Number of pages	2
ISSN	1431-9276
Publication status	Published - 2007
Event	MC 2007 : DGE, Deutschen Gesellschaft für elektronenmikroskopie - Saarbrücken, Germany Duration: 2 Sep 2007 → 7 Sep 2007 Conference number: 33

Conference	MC 2007 : DGE, Deutschen Gesellschaft für elektronenmikroskopie
Number	33
Country/Territory	Germany
City	Saarbrücken
Period	02/09/2007 → 07/09/2007

Cite this

@inproceedings{1259d070bebb11dcbee902004c4f4f50,

title = "TEM of free standing InAs nanoplates grown by molecular beam epitaxy",

author = "Erik Johnson and Martin Aagesen and C.B. S{\o}rensen and Lindelof, {Poul Erik} and P.E. Spiecker and W. J{\"a}ger",

year = "2007",

language = "English",

volume = "13",

pages = "322--323",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Suppl. 3",

note = "null ; Conference date: 02-09-2007 Through 07-09-2007",

}

TY - GEN

T1 - TEM of free standing InAs nanoplates grown by molecular beam epitaxy

AU - Johnson, Erik

AU - Aagesen, Martin

AU - Sørensen, C.B.

AU - Lindelof, Poul Erik

AU - Spiecker, P.E.

AU - Jäger, W.

N1 - Conference code: 33

PY - 2007

Y1 - 2007

M3 - Conference article

VL - 13

SP - 322

EP - 323

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - Suppl. 3

Y2 - 2 September 2007 through 7 September 2007

ER -