Towards scanning nanostructure X-ray microscopy

Anton Kovyakh; Soham Banerjee; Chia-hao Liu; Christopher J. Wright; Yuguang C. Li; Thomas E. Mallouk; Robert Feidenhans'l; Simon J. L. Billinge

doi:10.1107/S1600576723005927

Towards scanning nanostructure X-ray microscopy

Anton Kovyakh, Soham Banerjee, Chia-hao Liu, Christopher J. Wright, Yuguang C. Li, Thomas E. Mallouk, Robert Feidenhans'l, Simon J. L. Billinge

Research output: Contribution to journal › Journal article › Research › peer-review

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Original language	English
Journal	Journal of Applied Crystallography
Volume	56
Issue number	4
Pages (from-to)	1221-1228
Number of pages	8
ISSN	0021-8898
DOIs	https://doi.org/10.1107/S1600576723005927
Publication status	Published - 1 Aug 2023

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10.1107/S1600576723005927Licence: CC BY

vb5028Final published version, 1.15 MBLicence: CC BY

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Towards scanning nanostructure X-ray microscopy. / Kovyakh, Anton; Banerjee, Soham; Liu, Chia-hao; Wright, Christopher J.; Li, Yuguang C.; Mallouk, Thomas E.; Feidenhans'l, Robert; Billinge, Simon J. L.

In: Journal of Applied Crystallography, Vol. 56, No. 4, 01.08.2023, p. 1221-1228.

Research output: Contribution to journal › Journal article › Research › peer-review

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AU - Mallouk, Thomas E.

AU - Feidenhans'l, Robert

AU - Billinge, Simon J. L.

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