Using grating based X-ray contrast modalities for metrology

Jais Andreas Breusch Angel, Torsten Lauridsen, Robert Krarup Feidenhans'l, Mikkel Schou Nielsen, Leonardo De Chiffre

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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Original languageEnglish
Title of host publicationProceedings of the 14th euspen International Conference : 02/06/14 → 06/06/14, Dubrovnik, Croatia
Place of PublicationDubrovnik, Croatia
Publication date2 Jun 2014
Editioneuspen
Pages157-160
Publication statusPublished - 2 Jun 2014

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