Yes, one can obtain better quality structures from routine X-ray data collection

W. Fabiola Sanjuan-Szklarz, Anna A. Hoser, Matthias Gutmann, Anders Østergaard Madsen, Krzysztof Wozniak

Research output: Contribution to journalJournal articleResearchpeer-review

31 Citations (Scopus)
150 Downloads (Pure)
Original languageEnglish
JournalIUCrJ
Volume3
Pages (from-to)61-70
Number of pages10
ISSN2052-2525
DOIs
Publication statusPublished - 2016

Keywords

  • X-ray diffraction results
  • precision
  • independent atom model
  • transferable aspherical atom model
  • geometric parameters
  • TLS analysis

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